Instrument model: inVia Qontor

Manufacturer: Renishaw

Specifications and technical parameters:

1. Adopt advanced auto-focus transmission spectrometer, no chromatic aberration, no aberration

2. Sensitivity: signal-to-noise ratio ≥ 30:1 for silicon third-order peaks (approximately at 1440 cm-1), and the ability to observe fourth-order peaks

3. Spectral resolution: ≤1cm-1.

4. Spectral repeatability: ≤±0.02cm-1.

5. Using new confocal microscopy technology (digitally controlled CCD area)

6. Spatial resolution: Under x100x lens, using 532nm excitation wavelength to test single crystal silicon wafer, lateral resolution ≤ 0.5 micron, vertical resolution ≤ 1.5 micron, confocal depth continuously adjustable.

Features and functions:

1. Raman spectroscopy can characterize the chemical structure of materials with fingerprint characteristics of substances for material identification, providing crystal structure/type, chemical composition, phase structure, stress, crystal mass, semi-quantitative analysis, etc. It is suitable for testing different types of samples, solids, powders, gases, liquids, viscous liquids, etc.; inorganic materials, organic materials, semiconductor materials, biological samples, catalytic materials, etc.

2. Fast Raman imaging to characterize the distribution of different components, the distribution of certain properties, discovery/identification of unknown materials, comparative imaging and images, quantitative/semi-quantitative analysis, etc.

3. Laser real-time focus imaging makes it easy to analyze samples with uneven, curved, rough or highly dynamic surfaces.

Attachments and Configurations:

1. Configured with 532nm excitation wavelength, spectral range 100-9000cm-1; 632.8nm excitation wavelength, spectral range 100-6000cm-1; and 785nm excitation wavelength, spectral range 100-3500cm-1.

2. The laser Raman spectrometer is coupled to a research-grade Leica front-mounted microscope and a Leica inverted microscope simultaneously, with computer-controlled automatic switching and the ability to ensure that both microscopes can be used properly at the same time.

3. Equipped with XYZ 3D automatic stage with scale feedback control system, 2D & 3D fast imaging accessories.

4. Configured with LiveTrack laser real-time focus imaging, non-white pre-scan mode, allows easy analysis of samples with uneven, curved, rough or highly dynamic surfaces.

5. Integral Raman imaging, which can obtain the distribution of a component in a region at once, with no time difference between points in the region.

Reservation Website：http://202.113.64.51/genee/