Instrument model: Dimension IconXR

Manufacturer: 布鲁克

Specifications and technical parameters:

1. Scanner noise: RMS 0.03nm (vertical direction), lateral resolution: 0.1nm (XY direction).

2. Scanner range:Maximum scanning range 90um in XY direction, 10um in Z direction.

3. Sample table diameter 210mm maximum sample thickness ≥ 15mm.

4. Optical system: 5 megapixel CCD, 1.5 micron optical resolution. 180μm-1465μm preview field of view area.

Features and functions:

1. The Dimension iconXR is Bruker's top-of-the-line model of AFM, featuring high resolution, automated functions, and expandability, as well as easy operation and high testing efficiency.

2. With peak force tap imaging mode can precisely control the interaction force between the needle tip and the sample to 50pN, improving imaging resolution and reducing needle tip wear and contamination.

3. With nano-dynamic mechanical mode: based on nano-scanning probe technology for quantitative mechanical characterization at the nanoscale, with sample modulation frequency range from 0.1Hz to 300Hz.

4. With contact resonance mechanics mode: test the nanomechanical properties of superhard materials, modulus test maximum 300GPa.

Attachments and Configurations:

1、An XYZ integrated, probe-on-scan scanner with a closed-loop system is used for accurate positioning.

2、The latest NanoScope Model 6 controller includes 11 ADCs (three high speed), 13 DACs (five high speed), four digital signal lines (two in and two out), and three independent digital lock-in amplifiers.

3、Motor-controlled fully automatic sample stage with vacuum adsorption and 360-degree rotation enables fully automatic measurement and improves testing efficiency.

4、In addition to all morphological testing functions, it also has basic electromagnetic measurements, advanced mechanical measurements and other property testing accessories.

Reservation Website：http://202.113.64.51/genee/